54422 7 1 10 100 46.00 46.06 MTY I PCE 2 20 1 S RT PLAG SPARSELY PHYRIC BASALT 2 S % FRESH; 3 S TEX INTERSERTAL 4 S WS FLOW MARGIN* 5 P PLAG 1-2 TO 1TWINNED LATHS 6 P % APPROX COMP AN60-70; 7 P CPX TR 8 P % ONE MICROPHENOCRYST INCLUDED IN PLAG PHENO* 9 G OL 10 G % POSSIBLE PHASE OF OL,IDENTITY UNCERTAIN; 11 G PLAG 40 TO 0.2LATHS 12 G % PATCHY FLOW ALIGNMENT,OCCURS TOGETHER AS 13 G % GLOMEROPHYRIC,APPROX COMP AN60-70 14 G CPX 35 <0.05GRANULAR 15 G MAGN 1-2 TO 0.005SUBSKELETAL,GRANULAR 16 G GLASS 17 G % ALMOST OPAQUE* 18 V <0.1 EMPTY,CALC,SMEC 19 V % SMECTITE LINES SOME VESICLES* 20 54422 7 1 60 100 46.00 46.08 MTY I PCE 2 7 1 S RT PLAG SPARSELY PHYRIC BASALT; 2 S TEX INTERSERTAL; 3 S WS FLOW MARGIN* 4 P PLAG 1-2 <1TWINNED LATHES 5 P % LATHES ARE SLIGHTLY CORRODED,APPROX COMP AN60-70; 6 P CPX TR 7 54422 7 1 200 250 46.00 46.23 DMI I PCE 4 13 1 S RT APHYRIC BASALT; 2 S TEX INTERGRANULAR-INTERSERTAL* 3 P PLAG TR TABULAR 4 P % FEW XTLS LARGER THAN BULK OF LATHES ARE PRESENT* 5 G OL TR 0.1 6 G PLAG 42.5 0.2-0.03LATHES 7 G CPX 43.2 0.1EQUIDIMENSIONAL GRAINS 8 G MAGN 6.3 0.05SKELETAL 9 G GLASS 6.9 DEVITRIFIED 10 G % PERCENTAGES OBTAINED BY POINT COUNT* 11 A CLAY.MIN VESICLES VOLCANIC GLASS 12 V 0.15 1 SMEC,CALCITE ROUND 13 54422 7 1 900 950 46.00 46.93 FD I PCE 7E 9 1 S RT APHYRIC BASALT; 2 S TEX INTERGRANULAR-INTERSERTAL* 3 G PLAG 48.8 <0.05LATHS 4 G CPX 41.8 <0.03 5 G MAGN 5.5 6 G GLASS 3.3 7 G % PERCENTAGES OBTAINED BY POINT COUNT* 8 V TR 9 54422 7 112201310 46.00 47.27 DMI I PCE 11 13 1 S RT PLAG-CPX SPARSELY PHYRIC BASALT 2 S % FRESH; 3 S TEX INTERGRANULAR-INTERSERTAL* 4 P PLAG 1-2 0.3X0.8 5 P CPX 1-2 1 6 P % PLAG AND CPX ARE GLOMEROPHYRIC AGGREGATES* 7 G PLAG 34 .05-0.3LATHS 8 G CPX 54.1 0.1EQUIDIMENSIONAL GRAINS 9 G COMBINE 11.9 10 G % INCLUDES MAGN+ILMENITE+GLASS,GLASS IS DEVITRIFIED, 11 G % GLASS OCCURS IN PATCHES UP TO 3MM,PERCENTAGES 12 G % OBTAINED BY POINT COUNT* 13 54422 7 2 190 230 46.00 47.71 DMI I PCE 3 16 1 S RT APHYRIC BASALT 2 S % FRESH; 3 S TEX INTERSERTAL* 4 P PLAG TR 0.15-0.3 5 P % APPROX COMP AN65* 6 G OL 0.1 0.1EUHEDRAL GRAINS 7 G % ALTERED ALONG FRACTURES; 8 G PLAG 30.3 0.05-0.3LATHS 9 G CPX 48.9 0.15EQUIDIMENSIONAL 10 G MAGN 3.5 0.05SKELETAL 11 G % MAGN GRAINS ARE IN THE MATRIX; 12 G GLASS 17 CRYPTOCRYSTALLINE 13 G % OCCURS IN INTERSPACES AS PATCHES UP TO 1.5 MM, 14 G % PERCENTAGES OBTAINED BY POINT COUNT* 15 V 0.2 1 CLAY.MINS,CALC ROUND 16 54422 8 513201350 49.00 56.34 FD I PCE 14 12 1 S RT APHYRIC BASALT; 2 S TEX INTERGRANULAR-INTERSERTAL* 3 G OL TR 4 G % POSSIBLE ID OF OL; 5 G PLAG 53.4 <0.07 6 G % OCCURS AS LATHS AND INTERSTITIAL ANHEDRAL PATCHES; 7 G CPX 33.4 <0.04 8 G MAGN 5.3 9 G GLASS 7.4 10 G % PERCENTAGES OBTAINED BY POINT COUNT* 11 V TR 12 54422 9 5 720 750 54.00 60.74 FD I PCE 6 11 1 S RT APHYRIC BASALT; 2 S TEX INTERGRANULAR-INTERSERTAL* 3 G OL TR 4 G % POSSIBLE ID OF OL; 5 G PLAG 54 <0.15 6 G CPX 32 <0.15 7 G MAGN 5 <0.02ANHEDRAL 8 G GLASS 8.8 9 G % PERCENTAGES OBTAINED BY POINT COUNT* 10 V 0 11